COORDINATE MEASURING MACHINE Mitutoyo America Corporation announced the new STRATOApex574 Coordinate Measuring Machine to its STRATO-Apex line of CMMs. This new configuration offers a more compact footprint while still offering the same state-of-the-art blend of high-speed operation and highly accurate measurement.The STRATO-Apex574 is a compact bridge-type design featuring accuracy as low as 0.7ìm. It utilizes a 0.05ìm resolution scale and temperature range of 18 to 22 C° (64.4 to 71.6 F°). This CMM is ideal for manufacturers who produce high precision small parts for industries such a medical, precision mold, and aerospace that require a smaller footprint for CMM inspection. The STRATO-Apex line offers high speed and accuracy in measurement that is ensured by a specially designed machine body that has improved rigidity of the structure, a precision guide mechanism, ultra-high precision crystallized glass scales with near-zero thermal expansion and the incorporation of newly developed compensation technology. A standard vibration-dampening unit is included as a standard accessory to round out this CMMs advanced capabilities. The STRATO-Apex line features dual joysticks, air balanced Z-axis ram, precision air bearings on all axes, a USB, fully digital DC 32 bit Mitutoyo CNC CMM Digital Signal Processor controller with a PH10MQ quill mounted probe head featuring internal wiring. A wide range of inspections solutions including scanning probe, non-contact laser scanning, video, and surface roughness inspection can be added to ensure versatility that will satisfy almost any inspection need. MITUTOYO AMERICA CORPORATION | (630) 820-9666 | INFO@MITUTOYO.COM | WWW.MITUTOYO.COM SOFTWARE Verify Corporation announced the release of Verify Platform 6.0. The Verify Platform is a cloud-based technology platform that powers anti-counterfeiting, brand protection and digital marketing software solutions for Fortune 500 companies. The latest enhancements include a redesigned user experience and a responsive design that allows the application to work on a wide range of devices. Another key update is the expanded reporting and analytics engine, which enables companies to condense large volumes of data into actionable, real-time insights. These features give Verify clients added visibility into their supply chains as well as detailed reporting on how their consumers interact with brands. A key objective of the software update is to provide a powerful tool for Verify clients to visualize their data, whether they want real-time updates on digital marketing campaigns or global monitoring of product authentications. VERIFY CORPORATION WWW.VERIFYBRAND.COM. WWW.VERIFYENGAGE.COM PORTABLE CMM Hexagon Metrology announced the next generation of the ROMER Absolute Arm. The enhanced portable measuring arm features optimized ergonomics, a new wrist design, and greater stability to create a better user experience while further reducing operator fatigue. The portable CMM provides tactile and non-contact dimensional measurements in the aerospace, automotive, military, forming, tube bending and casting industries for applications requiring inspection, onmachine measurement, fixture and jig set-ups, and reverse engineering. The 6-axis portable measuring arm introduces a new wrist designed around the complex contours of the human hand. The new wrist on the 7-axis Absolute Arm has a more natural feel with rotation centered around the system’s probe. Both systems feature a lockable, Zero-G counterbalance which improves arm movement, protects it from hard falls, and enables singlehanded operation. In addition to upgraded ergonomic features, the 6-axis wrist includes a built-in work light and digital camera. Haptic feedback vibrates the wrist and warns the user of possible harmful conditions, making it ideal for noisy shop-floor environments. The arm also features a redesigned tube inspection configuration for quick inspections and reverse engineering of bend paths. The 7-axis arm is designed to accept an integrated or external, high performance laser scanner at any time. It may also be purchased without the scanner and used as a hard probing system. Both arms do not require recalibration after a probe or scanner change. All ROMER measuring arms are available with PC-DMIS Touch Portable, a measurement software that utilizes high-resolution Multi-Touch display technology on a tablet PC. The PC-DMIS Touch interface is particularly well suited to ROMER portable arm users and further complements their experience. HEXAGON METROLOGY | WWW.HEXAGONMETROLOGY.US MEASUREMENT SYSTEM Mahr Federal has introduced a new high-precision 2-D/3-D measuring station for checking contour and surface topography of aspheric optical lenses and other components during multi-stage grinding and polishing operations. The MarSurf LD 130 and 260 Aspheric units feature high measuring speed, measuring range of up to 260 mm, vertical resolution of 0.8 nm, and form deviations of less than 100 nm. As with all Mahr metrology systems, the MarSurf LD 130 and 260 Aspheric are backed by Mahr’s extensive worldwide service and application support network. The MarSurf LD 130 and 260 Aspheric facilitate the multi-set grinding and polishing manufacturing process for high precision optics by providing fast accurate 2-D and 3-D measurements for the evaluation of contour and surface topography. The system can be used for spherical and aspherical lenses, as well as many types of cylinder lenses, lens mounts, housings, and other mechanical components.Measuring speed is up to 10 mm/s for large lenses, and down to 0. 02 mm/s for micro lenses. The MarSurf LD 130/260 Aspheric includes a new probe system with a biomimetic probe arm design that provides increased stiffness, damping, and lower moment of inertia. A chip integrated in the probe arm provides probe identification and parameters, and verification of correct mounting position, allowing probe arms to be changed without recalibration.Automatic probe positioning allows even discontinuous surfaces to be measured. MAHR FEDERAL INC.(800) 343-2050 INFORMATION@MAHR.COM WWW.MAHR.COM GAGE From Jenoptik Industrial Metrology comes a crankshaft journal surface finish gage that greatly reduces the time required to collect and assess measurement data of virtually any crankshaft, any of its journals. As automotive engines must become more efficient, journal surface finish specifications become more critical to engine performance. Called a point of use gage by the company, the benchtop device is designed for use at the point of production, allowing manufacturers to check crankshafts immediately as they come off the grinders. Shafts can be checked as needed, an entire production run or a sampling. Skidded probes trace the diameters as the journal rotates. The probe arm is fully protected from damage (see image). The data is collected in seconds and can be immediately uploaded through Jenoptik’s proprietary Turbowave surface finish software which can process the data for myriad of uses, including Qdas and more. In operation, the operator places any size crankshaft onto V-guides, locks the part into position and adjusts the articulating arm to the desired lateral measurement position, using a horizontal arrow pointer on the ruler guide mounted to the base of the device. An air lock allows easy movement or locks the slide in place. Next, the operator scissors the device “up and over” onto the designated diameter--pin, crank, post, pump, or seal diameter. Pressing the measurement button completes the measurement. Previously, a journal surface finish measuring device would be laboriously repositioned using vertical and horizontal knob adjustments for each journal. The Jenoptik alternative measures a complete journal in “seconds,” compared to up to 30 seconds per journal. JENOPTIK INDUSTRIAL METROLOGY WWW.JENOPTIK.COM DATA COLLECTION Multi-DNC supports the Haas Machine Data Collection (MDC) feature by providing networking, DNC communications, machine monitoring and reporting, all from a single platform.With Haas ‘Setting 143’ enabled, Multi-DNC’s browser-based monitoring software, Multi-MDC™, provides real-time machine monitoring by automatically collecting machine output data to an MS-SQL database. Real-time Dashboards and Production History Reports display shop floor manufacturing data including machine utilization, OEE, cycle, idle, alarm, spindle, machine downtime reasons, tool usage, setup, parts count, machine maintenance information and more. In addition Multi-MDC will alert supervisors by text message and email for part count deviation and alarms. When Haas ‘Setting 143’ is enabled the control sends monitoring data through the RS-232 port to the Multi-DNC communications platform, which has been specially configured to read the Haas MDC data. Multi-DNC automatically turns off and then back on MDC output when downloading or uploading CNC programs through the RS-232 port. This feature provides single cable connectivity for networking, DNC communications, monitoring and reporting. In addition to Haas machine monitoring with ‘Setting 143’ enabled, the Multi-DNC solution also supports all legacy brand CNC controls. Customers can implement a shop-wide initiative of networking, DNC communications, machine data collection, monitoring and reporting, regardless of age or mixed brands of CNC controls. MULTI-DNC(877) 882-6362 WWW.MULTI-DNC.COM PROBE SYSTEM Mitutoyo America Corporation announced sales and support of the Renishaw PH20 probe system with the Crysta-Apex S500/700/900 series Coordinate Measuring Machines by Mitutoyo. The Crysta-Apex CMM line offers durability and high accuracy at an affordable price. It supports a wide range of inspections solutions including laser scanning, optical, and surface roughness inspection. With the addition of the highspeed scanning capabilities of the PH20 the Crysta-Apex CMM becomes the ideal solution for just about any part inspection, in the quality lab or on the shop floor. The PH20’s ‘head touches’ allow measurement points to be taken by moving only the head, rather than the CMM structure.Using only the rapid rotary motion of the head, points can be taken faster, and with improved accuracy and repeatability.Users of the PH20 probe head will immediately have access to the range of proven TP20 probe modules, providing a wide selection of trigger forces, directional sensing options and extensions to meet application requirements. The detachable modules provide crash protection and can be automatically changed using the TCR20 change rack (optional accessory). The TCR20 is a compact probe module rack for use with PH20 that provides the capability for quick and repeatable tool changing and tip correction based on the MCR20 rack systems. It securely stores modules for rapid automatic changing and protecting mating surfaces from any airborne contaminants within the working envelope of the machine. The TCR20 supports the full range of TP20 modules which are compatible with the PH20 system and features an integrated tip datum artifact in the center of the rack assembly, minimizing the cycle time of the tip correct procedure. MITUTOYO AMERICA CORPORATION(630) 820-9666 INFO@MITUTOYO.COM WWW.MITUTOYO.COM PROCESS MONITORING SYSTEM Marposs announces the introduction of its new generation Artis CTM V6 tool, machine and process monitoring system.The CTM system safeguards and optimizes complex production processes thanks to aligned in-process monitoring. The flexible interface concept enables problem-free integration within many environments, from entry solutions with no fieldbus connections, to branched Ethernet architectures such as PROFINET, Ethernet/IP™ and Modbus. Using the CTM system, evaluation and control are carried out with process-dependent strategies. Instead of searching for the smallest common denominator, CTM offers a range of strategies to optimally monitor the process. Each individual parameter can be very finely adjusted and precisely adapted to the process. Process monitoring operates precisely and reliably from the very first cut. In the basic installation, the CTM system is interfaced with the machine control and accepts inputs from various measuring transducers. Data capturing is accomplished using a sensor-less digital torque adaptor (DTA), wherein a selection of drive data is collected by the control for the evaluation of the torque of the spindle and the feed axis. Additional or alternative sensors are available for measuring strain and force, true power, torque, vibration and acceleration, acoustic emission, and standard power or voltage signals. Optionally, the CTM V6 system can provide Adaptive Control for adjusting the feed speed to compensate for material deviations.This function protects both machine and tool under high load by reducing the feed force. For gear hobbing applications, the CTM V6 system improves quality and extends the productive life of hobbing tools by utilizing wear-based method safeguards as opposed to traditional replacement at fixed regular interval methods. Monitoring of coolant flow using the CTM V6 system is especially useful for processes with small tools such as deep-hole drilling. Tool related, automatic and process accompanying documentation provided by the CTM V6 system is based on precise data. Visualization software is a fundamental part of the CTM V6 tool and process monitoring system, enabling thorough evaluation of processes in a user-friendly manner. Main benefits of the new CTM V6 system include comprehensive protection of tools and machines; process optimization; lower of unit costs by reducing the number of rejects; perfect adjustment even in the case of complex processes; and seamlessly documented component quality. MARPOSS CORP.(888) 627-7677 MARPOSS@US.MARPOSS.COM WWW.ARTIS.DE SCANNING AND TRACKING Steinbichler presents the new T-SCAN LV scanning and tracking all-in-one solution. The overall modular concept is developed around an easy-to-connect controller and is ready to use in just a few minutes. The combination of the Steinbichler T-SCAN LV handheld laser and the ergonomic T-POINT LV touch probe, makes individual point measurements quick and easy, while enabling precise 3D data collection for nearly all applications – particularly with large-scale objects. The increased measuring volume of 35 m³ of the new Steinbichler T-SCAN LV enables the scanning of objects with an overall length of up to six meters. With the ‘Dynamic Referencing’ function, the system enables precise measurements, even on moving objects or objects in an unstable environment. The addition of multiple T-TRACK LV trackers enables even greater freedom of movement for the measurement of large objects. Steinbichler proudly features ‘Intelligent Light Control’ (ILC) as a new ground-breaking enhancement to the COMET 6 highend sensor, 16M blue light 3D scanning system. ILC uses automatic recognition of components to adjust optical parameters such as component length and illumination. The result is an increased measurement speed along with an efficient, user-friendly measurement process. Intelligent Light Control independently analyses the data collection results of the Steinbichler COMET 6 blue light scanning system. In areas where there is excessive exposure or radiation due to the influence of light on the component, the amount of projection light is automatically reduced, allowing for precise results in minutes. Fringe light projection sensors, like the Steinbichler COMET 6, enable the quick and highly-precise measuring and scanning of a variety of parts (particularly with highly reflective components, such as sheet metal and chrome where reflections cause overexposure or underexposure). Hans STEINBICHLER WWW.STEINBICHLER.COM ATOMIC FORCE MICROSCOPE Park Systems introduces the Automatic Defect Review (ADR) AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects designed specifically for the semiconductor market without the need of reference markers. In terms of accuracy and productivity, Park’s new ADR process speeds up and improves the way defects are imaged and analyzed compared with more traditional manual AFM methods of defect review on the market. Furthermore, it is able to do this without the laborious and often damaging reference marks created on a sample wafer. Additionally, this new Park ADR AFM offers a significantly longer tip life than those of competitors by 10x~20x thanks to Park’s ground breaking True Non- Contact™ Mode AFM technology. The new 300mm bare wafer ADR provides a fully automated defect review process by AFM from transfer and alignment of defect maps to the survey and zoom-in scan imaging of defects that uses a unique remapping process that does not require any reference marker on a sample wafer. Unlike SEM which leaves destructive irradiation marks, square-shaped, on defect sites after its run, the new Park ADR AFM enables advanced coordinate translation with enhanced vision that uses the wafer edge and notch to automatically enable the linkage between a defect inspection tool and Park AFM. Since it is fully automated, it does not require any separate step to calibrate the stage of the targeted defect inspection system, increasing throughput by up to 1,000 percent. By utilizing Park’s proprietary coordinate translation technique, the new Park ADR AFM can accurately transfer the defect maps obtained from a laser-scattering defect inspection tool to a 300mm Park AFM system. This allows the AFM for high throughput, fully automated defect imaging. The defects are imaged in two steps; (1) a larger, survey scan image to refine the location, then (2) a smaller, zoom-in scan image to obtain the details of the defect, presenting automatic analysis of the defect type and the subsequent defect dimensions. PARK SYSTEMS | 408-986-1110 | WWW.PARKAFM.COM
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